Verifying EMI and EMC Early in the Design Process
New technology, developed and marketed by EMSCAN allows chip vendors (and other manufacturers of electronic devices) to quantify and immediately display spatial and spectral electromagnetic emissions profiles and verify electromagnetic compatibility (EMC) and electromagnetic interference (EMI). Two case studies display before and after results for each of the two new features.
The first study displays both spatial and spectral results for the Spread Spectrum Clock Generation (SSCG) feature. In the baseline test, the design team turned the SSCG function “Off” and then compared results with the SSCG turned “On.” The highly visual results display the obvious change in electromagnetic emissions.
The second study compared a second-generation half-duplex SERDES system with the third-generation full-duplex design. The methodology quantified and visually displayed the sources of emissions and documented compliance with test specifications developed by SAE (formerly the Society of Automotive Engineers).
The EMSCAN EMxpert for Real-time results provides examples of imaging results and more details about very-near-field EM scanning technology.
